CHI-ANNOUNCEMENTS Archives

ACM SIGCHI General Interest Announcements (Mailing List)

CHI-ANNOUNCEMENTS@LISTSERV.ACM.ORG

Options: Use Forum View

Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Lilly Sun Chen <[log in to unmask]>
Reply To:
Lilly Sun Chen <[log in to unmask]>
Date:
Thu, 4 Mar 2010 02:29:43 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (176 lines)
INVITATION:

=================
Please consider to contribute to and/or forward to the appropriate groups
the following opportunity to submit and publish original scientific
results.
=================

============== VALID 2010 | Call for Papers ===============

CALL FOR PAPERS, TUTORIALS, PANELS

VALID 2010: The Second International Conference on Advances in System
Testing and Validation Lifecycle
August 22-27, 2010 - Nice, France

General page: http://www.iaria.org/conferences2010/VALID10.html
Call for Papers: http://www.iaria.org/conferences2010/CfPVALID10.html

Submission deadline: March 20, 2010

Sponsored by IARIA, www.iaria.org
Extended versions of selected papers will be published in IARIA Journals:
http://www.iariajournals.org
Publisher: CPS ( see: http://www2.computer.org/portal/web/cscps )
Archived: IEEE CSDL (Computer Science Digital Library) and IEEE Xplore
Submitted for indexing: Elsevier's EI Compendex Database, EI's Engineering
Information Index
Other indexes are being considered: INSPEC, DBLP, Thomson Reuters
Conference Proceedings Citation Index

Please note the Poster Forum and Work in Progress options.

The topics suggested by the conference can be discussed in term of
concepts, state of the art, research, standards, implementations, running
experiments, applications, and industrial case studies. Authors are
invited to submit complete unpublished papers, which are not under review
in any other conference or journal in the following, but not limited to,
topic areas.

All tracks are open to both research and industry contributions, in terms
of Regular papers, Posters, Work in progress, Technical/marketing/business
presentations, Demos, Tutorials, and Panels.

Before submission, please check and conform with the Editorial rules:
http://www.iaria.org/editorialrules.html

VALID 2010 Tracks (tracks' topics and submission details: see CfP on the
site)

Robust design methodologies
Designing methodologies for robust systems; Secure software techniques;
Industrial real-time software; Defect avoidance; Cost models for robust
systems; Design for testability; Design for reliability and variability;
Design for adaptation and resilience; Design for fault-tolerance and fast
recovery; Design for manufacturability, yield and reliability; Design for
testability in the context of model-driven engineering

Vulnerability discovery and resolution
Vulnerability assessment; On-line error detection; Vulnerabilities in
hardware security; Self-calibration; Alternative inspections;
Non-intrusive vulnerability discovery methods; Embedded malware detection

Defects and Debugging
Debugging techniques; Component debug; System debug; Software debug;
Hardware debug; System debug; Power-ground defects; Full-open defects in
interconnecting lines; Physical defects in memories and microprocessors;
Zero-defect principles

Diagnosis
Diagnosis techniques; Advances in silicon debug and diagnosis; Error
diagnosis; History-based diagnosis; Multiple-defect diagnosis; Optical
diagnostics; Testability and diagnosability; Diagnosis and testing in mo
bile environments

System and feature testing
Test strategy for systems-in-package; Testing embedded systems; Testing
high-speed systems; Testing delay and performance; Testing communication
traffic and QoS/SLA metrics; Testing robustness; Software testing;
Hardware testing; Supply-chain testing; Memory testing; Microprocessor
testing; Mixed-signal production test; Testing multi-voltage domains;
Interconnection and compatibility testing

Testing techniques and mechanisms
Fundamentals for digital and analog testing; Emerging testing
methodologies; Engineering test coverage; Designing testing suites;
Statistical testing; Functional testing; Parametric testing; Defect- and
data-driven testing; Automated testing; Embedded testing; Autonomous
self-testing; Low cost testing; Optimized testing; Testing systems and
devices; Test standards

Testing of wireless communications systems
Testing of mobile wireless communication systems; Testing of wireless
sensor networks; Testing of radio-frequency identification systems;
Testing of ad-hoc networks; Testing methods for emerging standards;
Hardware-based prototyping of wireless communication systems; Physical
layer performance verification; On-chip testing of wireless communication
systems; Modeling and simulation of wireless channels; Noise
characterization and validation; Case studies and industrial applications
of test instruments;

Software verification and validation
High-speed interface verification and fault-analysis; Software testing
theory and practice; Model-based testing; Verification metrics;
Service/application specific testing; Model checking; OO software testing;
Testing embedded software; Quality assurance; Empirical studies for
verification and validation; Software inspection techniques; Software
testing tools; New approaches for software reliability verification and
validation

Testing and validation of run-time evolving systems
Automated testing for run-time evolving systems; Testing and validation of
evolving systems; Testing and validation of self-controlled systems;
Testing compile-time versus run-time dependency for evolving systems;
On-line validation and testing of evolving at run-time systems; Modeling
for testability of evolving at run-time systems; Near real-time and
real-time monitoring of run-time evolving systems; Verification and
validation of reflective models for testing; Verification and validation
of fault tolerance in run-time evolving systems

Feature-oriented testing
Testing user interfaces and user-driven features; Privacy testing;
Ontology accuracy testing; Testing semantic matching; Testing
certification processes; Testing authentication mechanisms; Testing
biometrics methodologies and mechanisms; Testing cross-nation systems;
Testing system interoperability; Testing system safety; Testing system
robustness; Testing temporal constraints; Testing transaction-based
properties; Directed energy test capabilities /microwave, laser, etc./;
Testing delay and latency metrics

Domain-oriented testing
Testing autonomic and autonomous systems; Testing intrusion prevention
systems; Firewall testing; Information assurance testing; Testing social
network systems; Testing recommender systems; Testing biometric systems;
Testing diagnostic systems; Testing on-line systems; Testing financial
systems; Testing life threatening systems; Testing emergency systems;
Testing sensor-based systems; Testing testing systems


==========
VALID Advisory Chairs
Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
Andrea Baruzzo, Universitā degli Studi di Udine, Italy
Lydie du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France
Petre Dini, Concordia University, Canada / IARIA
Henry Muccini, University of L'Aquila, Italy

VALID 2010 Research Institute Liaison Chairs
Alexander Klaus, Fraunhofer Institute for Experimental Software
Engineering (IESE), Germany
Juho Perälä, VTT Technical Research Centre of Finland, Finland

VALID 2010 Industry/Research Liaison Chairs
Davide Pandini, STMicroelectronics - Agrate Brianza, Italy
Juho Perälä, VTT Technical Research Centre of Finland, Finland
Raj Senguttuvan, Texas Instruments - Dallas, USA
Avik Sinha, IBM TJ Watson Research Center - Hawthorne, USA
Alin Stefanescu, SAP Research, Germany
Bart Vermeulen, NXP Semiconductors, The Netherlands

VALID 2010 Special Area Chairs
Testing of wireless communications systems
    Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
Testing and validation of run-time evolving systems
    Stefan van Baelen, KU Leuven Belgium
    Hans-Gerhard Gross, Delft University of Technology, The Netherlands

Committee members: http://www.iaria.org/conferences2010/ComVALID10.html
====================

    ---------------------------------------------------------------
                To unsubscribe, send an empty email to
     mailto:[log in to unmask]
    For further details of CHI lists see http://sigchi.org/listserv
    ---------------------------------------------------------------

ATOM RSS1 RSS2